Researchers from Embrapa and Unemat have identified the reflectance characteristics of healthy soybean plants and those infected by the nematode Aphelenchoides besseyi, which causes Green Stem Syndrome, also known as "Crazy Soybean II." Identifying the spectral signature of symptomatic plants is the first step toward developing a sensor to aid in crop management.
In a greenhouse study at Embrapa Agrossilvipastoril (Sinop-MT), soybean plants in pots were inoculated with varying populations of the nematode. Using spectroradiometry, the reflectance characteristics of different plant groups were analyzed.
“We obtained signatures of healthy plants and plants infected with different nematode population intensities. These signatures are displayed as bands on the leaves,” explains researcher Valéria Faleiro.
According to Faleiro, this is the initial step in refining the technology to eventually create a sensor for use in soybean fields. “This methodology will accelerate field monitoring, making the identification of nematode-infested areas more efficient, thus improving management practices,” she predicts.
The continuation of this research depends on the approval of a new project, which will allow for further greenhouse testing and field validation.
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